Velox 3

浮动操作按钮

• 方便快捷的相机视图设置
• 只需点击鼠标，即可切换所选摄像机视图的灯光和图像设置

工作流程向导

• 指导晶圆片安装，校准工具和自动辅助的工作流程
• 工作流程向导”仅显示与任务相关的设置和选项
• 向导设置可以随时更正-无需重启
• 向导帮助可在出现错误时提供智能解决方案

进度条

• 设置、校准和测量任务具有可视化进度显示
•  随时随地的状态信息更新

通知提醒

• 通知用户相关事件，例如“成功校准”
• 与用户交互并帮助提供智能解决方案

CONTACT INTELLIGENCE TECHNOLOGY

Non-Stop Autonomous Semiconductor Test

With FormFactor’s unique Contact Intelligence technology, Velox 3 enables 24/7 autonomous semiconductor test. Contact Intelligence combines smart hardware design, innovative software algorithms and years of experience to create a technology that provides benefits across a wide range of applications. This allows lengthy test routines to be performed overnight or the weekend without operator intervention – even over a wide temperature range. Contact Intelligence accelerates time to accurate data, time to market and ultimately – time to profitability.

SECS/GEM

Improving your Production Processes

SECS/GEM interfaces are a SEMI-standard industry-specific integration layer for semiconductor production. SECS/GEM interfaces establish the connection between the system and the higher level. Production and plant data, alarms, process values, process parameters etc. are transferred via SECS/GEM.

AUTOALIGN

Quickest Wafer Alignment and Mapping

Velox AutoAlign is the most ergonomic and quickest way to align a wafer in X, Y and theta and determine the wafer diameter and die size. It generates a wafer map corresponding to the evaluated die indices and number of recognized dies in both axes.

VUETRACK

VueTrack™ enables unattended testing over multiple temperatures for positioners or probe cards by automaticall aligning probes to pads, utilizing the eVue Pro microscope. VueTrack eliminates the need for manual re-adjustment and ensures constant contact quality.

REALIGN

Automatically Aligning Probe to Pads

ReAlign™ enables unattended testing over multiple temperatures for probe cards on the CM300xi probe station by automatically aligning probes to pads, utilizing three system-integrated cameras. It is recommended especially for applications with limited microscope view, such as vertical and Pyramid probe cards, or when using a test head.

CELLVIEW

CellView allows you to easily navigate and orientate on parts of the wafer that are out of view.

WORKFLOW GUIDE

Easy Step-by-Step Guidance

The Velox Workflow Guide enables unexperienced users to perform successful measurements by guiding the operator step-by-step through different processes, no matter if these are simple procedures or complex measurements.

VELOX SETUP TOOL

All Global Settings in One Place

The Velox Setup Tool combines all global Velox settings in one place – from autostart preferences, interface and device settings to license management. This simplifies the setup process, reduces training needs and safes time. Further Velox settings, such as for Control Center, WaferMap and Spectrum, will be successively integrated into the Setup Tool with the next Velox versions.