ACP探针 – 同轴

ACP探针 - 同轴 概述

The Air Coplanar Probe (ACP) is a rugged microwave probe with a compliant tip for accurate, repeatable measurements for both on-wafer as well signal integrity applications. It features excellent probe-tip visibility and the lowest loss available. The ACP Probe delivers outstanding compliance for probing non-planar surfaces. These probes offer stable and repeatable over-temperature measurements, with a typical probe life of 500,000 contacts on gold pads. Configurations for both single and dual signal applications are available. The ACP probe combines outstanding electrical performance with precise probe mechanics, and is today’s most widely used microwave probe. Fast delivery is available on 100, 125, 150, 200, and 250 µm pitched probes