Integrated Measurement Systems
FormFactor’s IMS products deliver robust, turn-key functionality, peace of mind, and a faster path to collecting high-quality on-wafer measurement data for today’s important and challenging test applications. Integrated Measurement Systems unite instruments and other products from FormFactor’s partners, including Keysight Technologies, along with FormFactor’s probe systems, probes, and everything else needed to deliver critical data for devices and integrated circuits on the wafer.
Our high-performance cryogenic probe stations for on-wafer and multi-chip measurements support a wide range of challenging applications, including IR-sensor test, radiometric test, DC and RF measurements at cryogenic temperatures. The systems can handle wafers up to 300 mm, and support cold filter, cold shutter and selectable f/value aperture as well as multiple optical instruments like IR radiation sources (black bodies). Up to eight probe positioners and/or a probe card can be integrated. Automatic chip alignment, OCR and wafer mark reading are exclusive features of our fully- and semi-automated systems. Cooling options include liquid helium (LHe), liquid nitrogen (LN2) or cryogen-free cooling. With a large install base of >80 stations worldwide, we bring expertise and technical know-how to provide the right solution for your measurement challenge.
The HPD Cryogenic Chip-scale Probe Stations tackle problems like long turnaround times, high noise, and low signal capabilities. By employing world class technology and superior cryogenic probing knowledge, these systems enable accurate measurements at cryogenic temperatures.
The HPD Cryostats provide an alternative to more expensive and space consuming dilution refrigerators (DR). These Adiabatic Demagnetization Refrigerators (ADR) are great for applications that do not need the full power of a DR, but still require sub Kelvin temperatures. Our ADRs provide a faster, compact, and less costly path to temperatures a fraction of a degree above absolute zero. The new Continuous ADRs (CADR) allow you to stay cold without ever warming up.
Our vacuum and pressure probe stations for on-wafer measurements in a high vacuum or controlled pressure environment enable precise µ-bolometer test (un-cooled IR-FPA), MEMS characterization (inertial MEMS, resonators and RF MEMS, pressure sensors), IV/CV, RF/mmW and Opto measurements. Multiple optical instruments like IR radiation sources (black bodies), and up to eight probe positioners and/or a probe card can be integrated. The high stability design provides excellent contact quality and accurate measurement results in a condensation-free test environment. Step and repeat capability enables high throughput with our semi-automated systems.
我们提供了价格适中且完整的水平和垂直电路板测试系统，从而实现了 IC 封装和电路板的精准电气测量。