150mm探针台
简便-灵活-面向未来：使用专用入门套装定制您的150mm手动探针台，价格$13,880起。
200mm探针台
无论应用是器件表征，建模，工艺开发，设计调试或IC失效分析，Cascade 200mm手动和自动探针台可满足最先进的半导体工艺和大规模集成电路测量所需的精度和多功能性。
300mm探针台
Cascade 300mm探针台为手动和自动在片测试树立了标准，可提供满足各种先进、复杂测试要求所需的精度和多功能性。
自动化助手
FormFactor公司的Contact Intelligence技术结合智能硬件设计和创新的软件算法，为实验室工程阶段和多种生产应用阶段提供精确的探针与pad接触、自动重新校准。FormFactor公司现有专门的自动RF测量、DC测量和硅光（SiPh）测量方案。
集成测量系统
FormFactor的IMS产品提供强大的交钥匙功能，让您安心地更快地收集高质量的晶圆在片测量数据，用于当今重要且具有挑战性的测试应用。集成测量系统结合了来自FormFactor合作伙伴的仪器和其他产品，包括Keysight Technologies，以及FormFactor的探测系统、探针和为晶圆在片器件和集成电路提供关键测试数据所需的一切。
大功率探针台
功率半导体器件的广泛使用产生了对功率器件快速高效地进行特性分析的紧迫需求。Cascade 提供了晶圆上功率器件特性分析系统，旨在缩短新型功率器件的上市时间并跟上生产进度的要求。
晶圆/碎片测量系统
Our high-performance cryogenic probe stations for on-wafer and multi-chip measurements support a wide range of challenging applications, including IR-sensor test, radiometric test, DC and RF measurements at cryogenic temperatures. The systems can handle wafers up to 300 mm, and support cold filter, cold shutter and selectable f/value aperture as well as multiple optical instruments like IR radiation sources (black bodies). Up to eight probe positioners and/or a probe card can be integrated. Automatic chip alignment, OCR and wafer mark reading are exclusive features of our fully- and semi-automated systems. Cooling options include liquid helium (LHe), liquid nitrogen (LN2) or cryogen-free cooling. With a large install base of >80 stations worldwide, we bring expertise and technical know-how to provide the right solution for your measurement challenge.
芯片级测量系统
The HPD Cryogenic Chip-scale Probe Stations tackle problems like long turnaround times, high noise, and low signal capabilities. By employing world class technology and superior cryogenic probing knowledge, these systems enable accurate measurements at cryogenic temperatures.
低温恒温器
The HPD Cryostats provide an alternative to more expensive and space consuming dilution refrigerators (DR). These Adiabatic Demagnetization Refrigerators (ADR) are great for applications that do not need the full power of a DR, but still require sub Kelvin temperatures. Our ADRs provide a faster, compact, and less costly path to temperatures a fraction of a degree above absolute zero. The new Continuous ADRs (CADR) allow you to stay cold without ever warming up.
真空/压力系统
Our vacuum and pressure probe stations for on-wafer measurements in a high vacuum or controlled pressure environment enable precise µ-bolometer test (un-cooled IR-FPA), MEMS characterization (inertial MEMS, resonators and RF MEMS, pressure sensors), IV/CV, RF/mmW and Opto measurements. Multiple optical instruments like IR radiation sources (black bodies), and up to eight probe positioners and/or a probe card can be integrated. The high stability design provides excellent contact quality and accurate measurement results in a condensation-free test environment. Step and repeat capability enables high throughput with our semi-automated systems.
认证二手设备
电路板测试系统
我们提供了价格适中且完整的水平和垂直电路板测试系统，从而实现了 IC 封装和电路板的精准电气测量。
定制探针台系统
针对各种挑战性的应用定制的解决方案
